SUMMARY The reflected‐light differential‐interference microscope is a simple optical instrument easy to use and adjust, which reveals surface contours in variations of light intensity or in colour with a clarity and sensitivity not previously achieved. It can reveal new structures or display familiar tissue and cellular architecture in new and refreshing aspects. This type of microscope can provide insights into surface characteristics in metallurgy, microelectronics, biology, etc. Understanding how the differential‐interference microscope works, how to control it and how to interpret the images produced, is essential to using the microscope fruitfully.
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Hoffman et al. (1970) studied this question.
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