Scanning electrochemical microscopy (SECM) has been used to study the oxidation of iodide at Ta electrodes covered by a thin (∼2.5 nm) film of Ta(2)O(5). SECM images of surface activity reveal that the voltammetric response of a macroscopic Ta electrode comprises the individual responses of a large number of microscopic sites, each with its own unique electrochemical behavior. Oxide film growth and metal dissolution occur simultaneously with iodide oxidation, resulting in a complex voltammetric response. The component of the voltammetric current due to iodide oxidation can be separated from the total current by SECM analysis. The growth of nanometer-thick oxide films can also be studied using SECM by monitoring the rate at which iodide is oxidized at the electrode surface.
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Basame et al. (1999) studied this question.
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