Characterization of Spinel‐Type Cobalt and Nickel Oxide Thin Films by X‐Ray Near Grazing Diffraction, Transmission and Reflectance Spectroscopies, and Cyclic Voltammetry

The application of three analytical techniques, x‐ray near grazing diffraction, infrared transmission and reflectance spectroscopy, and UV‐visible‐near‐infrared reflectance spectroscopy, to the characterization of cobalt cobaltite, , and of nickel cobaltite, films, is reported. Thin films of and , in a 10–1000 nm thickness range were prepared by two methods: spraying and sputtering. Characteristic spectra and thickness limits are discussed based on theoretical considerations. Corresponding cyclic voltammograms are presented and discussed. Among the four methods of investigation of the cationic composition of the films, cyclic voltammetry appears to be the least sensitive.