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The author describe their incorporation of I/sub DDQ/ testing into the design of the PA-7100LC PA-RISC microprocessor. They also discuss design guidelines, measurement techniques, results after fabrication and volume production, and suggested improvement. Their 900,000-transistor custom design supports I/sub DDQ/ testing to ensure high quality without compromising 100-MHz-plus performance.>
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Josephson et al. (1995) studied this question.
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