Ballistic-electron-emission-microscopy (BEEM) studies of Mg, Ni, Cu, Ag, and Au films on cleaved n-type GaP(110) show uniform Schottky-barrier heights across the surfaces, which varied from 1.02 eV for Mg to 1.41 eV for Au. BEEM images reveal areas of sharp current variations (contrast) that coincide with topographic gradients on the metal surfaces. Deduced Schottky-barrier heights depend on the transport model; a 5/2 power-law dependence of the BEEM current on applied voltage results if nonclassical transmission across the interface is included.
No takes yet. Share an insight, caveat, or question.
Prietsch et al. (1991) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: