Space resolved X‐ray spectroscopy with a curved crystal X‐ray spectrometer for an extended source such as the Tokamak is discussed. Limits of resolution caused by instrumental broadening are shown, using various entrance apertures. Ion density distribution may be obtained by measurement of intensity variation along spectral lines. In order to obtain ion temperature distribution about the central plasma line in the Tokamak, a novel method is proposed. In this method reflection in the curved crystal takes place through the double reflection process. This is possible as practically no instrumental broadening is caused when using this method, while it reflects the radiation in a strictly space resolved mode.
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B. S. Fraenkel (1980) studied this question.
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