We have investigated the spatial distribution of electric and magnetic fields and propagation characteristics of surface polaritons in ultrathin films with the thickness of less than 10 nm. The long-range surface polariton configuration, such as the dielectric/ultrathin film/dielectric geometry, was employed. For Ag thin film, the propagation lengths have been calculated by using effective dielectric constants evaluated from experiments or by a semi-empirical method. The propagation length monotonically increases with decreasing the thickness of Ag film. We have found that there is a sharp resonance in attenuated total reflection (ATR) spectra even for a s-polarized light.
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Takabayashi et al. (1992) studied this question.
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