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May 7, 2004Applied Physics Letters

Investigation of forward and reverse current conduction in GaN films by conductive atomic force microscopy

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JSJoshua SpradlinThomas Jefferson National Accelerator FacilitySDS. DoğanBalıkesir UniversityJXJinqiao XieThe University of Texas at Dallas

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Spradlin et al. (2004) studied this question.

synapsesocial.com/papers/6a9c5e5f8817ee36af5d258dhttps://doi.org/10.1063/1.1751609
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