Ellipsometry was used to study the electrodeposition of polymer films formed by oxidation of bipyrazine, polyvinylferrocene, and aniline. For polymeric films of limited thickness displaying good optical characteristics ( i.e. , high reflectivity, uniform coverage, and homogeneity), the film refractive index and thickness were determined. Nonideal ellipsometric behavior was observed when film morphology varied with film growth. Polyvinylferrocene films in were shown to be 15% thicker in the oxidized form than in the reduced form.
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Carlin et al. (1985) studied this question.