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Two wavelength series (373‐435 nm) of GaInN/GaN triple quantum well LED‐structures, one on sapphire and one on GaN‐templates, as well as a quantum well thickness series were grown by MOVPE. In order to study luminescence efficiency limiting effects the LED‐structures were characterized by electroluminescence‐ and by temperature and excitation power dependent photoluminescence spectroscopy. The electroluminescence output and the internal quantum efficiency are peaked near 400 nm in both wavelength series, but output and efficiency are significantly enhanced for growth on templates. The photoluminescence data indicate that below 400 nm the efficiency, apart from insufficient vertical carrier confinement, is limited by poor localization within the quantum film plane while above 400 nm piezo‐electric fields appear to be an important efficiency limiting effect. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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Kunzer et al. (2007) studied this question.
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