Experimental study reveals a reduced dielectric constant in lead sulfide quantum-dot films, indicating standard models overestimate nanoparticle permittivity.
We study the dielectric constant of lead sulfide quantum dot (QD) films as a function of the volume fraction of QDs by varying the QD size and keeping the ligand constant. We create a reliable QD sizing curve using small-angle X-ray scattering (SAXS), thin-film SAXS to extract a pair-distribution function for QD spacing, and a stacked-capacitor geometry to measure the capacitance of the thin film. Our data support a reduced dielectric constant in nanoparticles.
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Grinolds et al. (2014) studied this question.
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