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Two-dimensional arrays of overdamped Josephson junctions under microwave irradiation have been examined experimentally. We show that the shape of the Shapiro steps in the current–voltage curve of the array is closely related to the critical current spread of the junctions and that its dynamic resistance is closely related to the number of frequency locked junctions which are visualized by low-temperature scanning electron microscopy.
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Laub et al. (1998) studied this question.
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