A five-band, high-sweep-speed reflectometer system for the RFX reverse field pinch experiment has been developed. To control the high-noise environment we improved the intermediate frequency amplifying and conditioning system. We checked the modified system using a new in situ calibration method that pointed out the improvements. This new method is a suitable one for calibrating the reflectometer, because it allows one to place a mirror in a well-defined position, thus giving a good radial (<2 mm) and angular resolution (<10−3 rad). Preliminary results on maximum density time evolution are presented.
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Moresco et al. (1995) studied this question.
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