Direct lattice images of silicon—silicide interfaces are obtained with cross-sectional specimens. The SiNiSi2, SiNiSi, and SiPd2Si interfaces are studied and lattice images of their interfaces are given. The lattice images reveal interfacial defects as, e.g., misfit dislocations and interface steps, which cannot always be observed with conventional TEM. The interpretation of lattice images of interfaces is discussed and a systematic classification of interface defects and their appearance on lattice images is given for the case of the SiPd2Si interface. The results can be generalized for all coherent interfaces, including grain boundaries.
No takes yet. Share an insight, caveat, or question.
H. Föll (1982) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: