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Measurements of pinning forces due to statistically distributed vacancies and interstitials (Frenkel pairs) in niobium are reported. The defects were produced by low temperature 3 MeV electron irradiation. The results indicate that fluctuations in the defect density and not the interaction between a single point defect and a flux line are responsible for the observed pinning effects.
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Ullmaier et al. (1970) studied this question.
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