Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
September 25, 2003Review of Scientific Instruments

Mechanical properties of periodic porous silica low-k films determined by the twin-transducer surface acoustic wave technique

View Full Paper
Ask AI
Bookmark
Share

Authors

XXXia XiaoJiangnan UniversityNHNobuhiro HataOita UniversityKYKazuhiro YamadaNagoya University

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Xiao et al. (2003) studied this question.

synapsesocial.com/papers/6a9da04bc22b256abad9ba30https://doi.org/10.1063/1.1611615
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Surface acoustic wave depth profiling of elastically inhomogeneous materials2000 · 59 citations
  2. 2Encyclopedia of Applied Physics1994 · 573 citations
  3. 3Effects of Surfactants on the Properties of Ordered Periodic Porous Silica Films2003 · 23 citations
  4. 4Critical properties of nanoporous low dielectric constant films revealed by Brillouin light scattering and surface acoustic wave spectroscopy2002 · 64 citations