High resolution structure images around the pole pattern of a bent crystal. Application: deformation of a crystal near a defect

SUMMARY The variation of high resolution structure images with the tilt of the incident electron beam has been studied on bent crystals. By systematically computing images for different situations we show that the aspect of the image can be linked to the angle of tilt of the incident beam, and to the direction of tilt. Good agreement is obtained between micrographs and computed images. As one possible application, we analyse the surroundings of a planar defect.