The optimization of the write and read track-widths based on the new concept of a soft error rate (SER) contour map is proposed. In the calculation of the SER, the side fringe erase bands, microtrack MR sensitivity profile, and mechanical positioning accuracy are taken into account. From the SER map, nominal write and read track-widths can be optimized so that the process tolerance of the track-width can be maximized. Highly improved accurate positioning techniques for sub-micron track-width processing and suppression of the erase band are necessary for realizing areal densities over 10 Gb/in/sup 2/.
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Tomiyama et al. (1998) studied this question.
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