This paper addresses the use of static SIMS (S-SIMS) for the speciation of inorganic compounds. Specifically, the use of SF5+ and ReO4− polyatomic primary ions for the analysis of binary salts is compared to bombardment with Ga+. The features of the mass spectra are discussed with respect to the gain in secondary ion intensity and the increased production of molecule-specific adduct ions and structural fragments when using polyatomic instead of monatomic ion bombardment.
No takes yet. Share an insight, caveat, or question.
Ham et al. (2002) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: