In this work, we utilize the finite difference time domain (FDTD) method to investigate the Purcell factor, light extraction efficiency (EXE), and cavity quality parameter (Q), and to predict the modulation response of Ag-clad flip-chip GaN/InGaN core-shell nanowire light-emitting diodes (LEDs) with the potential for electrical injection. We consider the need for a pn-junction, the effects of the substrate, and the limitations of nanoscale fabrication techniques in the evaluation. The investigated core-shell nanowire consists of an n-GaN core, surrounded by nonpolar m-plane quantum wells, p-GaN, and silver cladding layers. The core-shell nanowire geometry exhibits a Purcell factor of 57, resulting in a predicted limit of 30 GHz for the 3dB modulation bandwidth.
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Nami et al. (2014) studied this question.
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