Stress and Electrical Field Responses of X5R Type Multilayer Ceramic Capacitor with Ni Internal Electrode

Uniaxial compressive stress and electrical field responses were investigated using the X5R-type multilayer ceramic capacitor with Ni internal electrode (Ni-MLCC). Capacitance change was dependent on the applied direction of the stress. TCC curve under compressive stress and electrical field was measured. The peak of the capacitance at around room temperature was shifted to a higher temperature as the compressive stress was increased although that at around 125°C was almost constant. On the contrary, the peak of the capacitance at around room temperature was shifted to a lower temperature under a dc electrical field. Frequency response measurement revealed that compressive stress suppressed the relaxor-like behavior of the shell phase while a dc electrical field did not. In addition, the saturated capacitance after aging depended on the measurement temperature for the sample under compressive stress, while it did not depend on the measurement temperature for the sample under a dc electrical field. It was clearly shown that the influence on the capacitance was different between compressive stress and a dc electrical field.