Key result
Cardiac device implantations are associated with an overall complication rate between 5.3% and 14.3%, with risks increasing with the number of electrodes and in redo procedures.
Case Report
May heighten caution in redo procedures with multiple electrodes; leaves open precise risk estimates pending larger studies.
An overall complication rate between 5.3% and 14.3% is observed for cardiac device implantations.1 The complication risk increases with rising number of electrodes used and is higher in the case of redo procedures. Complications can be divided by their timing into interprocedural, periprocedural (within 7 days), or late (after 7 days) and occur after access site problems using a subclavian or axillary puncture, or are related to lead placement itself owing to dislocation or perforation. Finally, infection and lead malfunction can occur.
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Grebmer et al. (2020) conducted a case report in Atrial lead perforation early after device implantation. Cardiac device implantation was evaluated. Cardiac device implantations are associated with an overall complication rate between 5.3% and 14.3%, with risks increasing with the number of electrodes and in redo procedures.
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