Low-temperature transport measurements on superconducting film--normal wire--superconducting film (SNS) junctions fabricated on the basis of thin superconducting polycrystalline PtSi films are reported. Due to the perfectness of SN boundaries in the junctions, zero bias resistance dip related to pair current proximity effect and subharmonic energy gap structure originating from phase coherent multiple Andreev reflections have been observed and studied.
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Kvon et al. (2000) studied this question.
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