Single scan deep-level transient spectroscopy

A new single scan method for obtaining deep level trap parameters is presented. This method represents an improvement over previous single scan approaches because it does not involve numerical analysis and it uses data over the entire temperature range of the deep-level transient spectroscopy peak. Data are presented for an isolated deep level, the E center. The usefulness of this new method is also demonstrated by an example of successful analysis of overlapping deep level signals. The new single scan method maintains the simplicity of the traditional method of data collection. However, the single temperature scan saves time and more important, is often more accurate than the traditional multitemperature scan technique.