We report a bistable resistance switching behavior of CuO thin films. To understand the resistance switching mechanism, we have studied impedance spectroscopy and nanoscale electrical property. From the frequency-dependent impedance properties of CuO thin films in high resistance (ROFF) and low resistance (RON) states, we infer the formation of conducting paths generated by external bias as a possible origin of the bistable resistance states. In addition, the observation of inhomogeneous conducting path using a conducting atomic force microscope is also consistent with our inference.
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Kim et al. (2009) studied this question.
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