Threshold field for soft damage and electron drift velocity in InGaN two-dimensional channels, Ardaravičius, L, Kiprijanovič, O, Liberis, J, Šermukšnis, E, Matulionis, A, Ferreyra, R A, Avrutin, V, Özgür, Ü, Morkoç, H
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Ardaravičius et al. (2015) studied this question.
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