The specific current-voltage-temperature dependence of space-charge-limited conduction processes in semiconductors and insulators is largely determined by the distribution in energy of traps within the band gap. A linear dependence of current-density on the square of the applied voltage, may be alternatively interpreted in terms of either a single discrete trapping level, or of an exponential trap distribution. The two types of trapping behavior may be distinguished using measurements of the variation of current with temperature for a range of different constant voltages.
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R.D. Gould (1982) studied this question.
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