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September 1, 1996Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Comment on ‘‘Domain structure and polarization reversal in ferroelectrics studied by atomic force microscopy’’ [J. Vac. Sci. Technol. B 13, 1095 (1995)]

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Abstract

Ferroelectric domain observation by static piezoelectric deformation has been described by Gruverman et al. If the observed protrusions are caused by piezoelectric deformation induced by depolarization fields of domains, as suggested in the article, serious questions arise. The author believes that the protrusions are not ferroelectric domains. In imaging static deformation, it is difficult to distinguish corrugation due to piezoelectric deformation from those of the other possible causes.

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Keiji Takata (1996) studied this question.

synapsesocial.com/papers/6a9e591aef36093b66944679 https://doi.org/10.1116/1.588541

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