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June 1, 1977IEEE Transactions on Microwave Theory and Techniques

Precise Dielectric Measurements of Low-Loss Materials at Millimeter and Submillimeter Wavelengths

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MAMohammed N. AfsarTufts UniversityGCG.W. ChantryNational Physical Laboratory

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Afsar et al. (1977) studied this question.

synapsesocial.com/papers/6a9e643f5924b374fbf9ad32https://doi.org/10.1109/tmtt.1977.1129147
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