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The effect of the ratios of the cationic components and internal strains on the critical temperature T c and the dielectric characteristics of BSTO ferroelectric films grown on α-Al2O3 [1012] and LaAlO3 substrates were investigated. Ion backscattering diagnostics revealed a barium deficiency in the surface layer of the films and showed that the films differ in structural quality.
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Karmanenko et al. (1999) studied this question.
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