We have calculated the imaginary part of the dielectric constant ε₂ for Si and Ge using interband matrix elements obtained from the full orthogonalized-plane-wave (OPW) wave function (rather than only the plane-wave portion). The results show that for the class of semiconductor represented by Si and Ge a pseudopotential description including pseudo-wave-function matrix elements is quite adequate for obtaining the one-electron transition probabilities.
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J. P. Van Dyke (1972) studied this question.
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