An availability and a reliability prediction has been made for a high-voltage direct-current (HVDC) module of VSC (Voltage Source Converter) containing DC/DC converter, gate driver, capacitor and insulated gate bipolar transistors (IGBT). This prediction was made using published failure rates for the electronic equipment. The purpose of this prediction is to determinate the additional module redundancy of VSC and the used method is “binomial failure method”.
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Kim et al. (2015) studied this question.
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