The determination of the coercive voltage from the height of domain-switching current plateau in ferroelectric thin films provides the liability to estimate the coercive-voltage shift with imprint time shortly on the order of polarization-reversal time. The voltage shift exhibits a linear time dependence in a logarithmic scale above an initial time (∼1μs), below which the voltage is nearly constant. The modeling of imprint on the basis of the interfacial charge injection at different stressing voltages strongly supports Schottky emission as a dominant mechanism, instead of Frenkel-Poole emission and Fowler-Nordheim tunneling.
No takes yet. Share an insight, caveat, or question.
Jiang et al. (2007) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: