High‐Dielectric‐Constant and Low‐Loss Microwave Dielectric in the (1− x )Nd(Zn 1/2 Ti 1/2 )O 3 – x SrTiO 3 System with a Zero Temperature Coefficient of Resonant Frequency

High‐dielectric‐constant and low‐loss ceramics in the (1− x )Nd(Zn 1/2 Ti 1/2 )O 3 – x SrTiO 3 system have been prepared by the conventional mixed‐oxide route and their microwave dielectric properties have been investigated. A two‐phase system was confirmed by the X‐ray diffraction patterns, the energy‐dispersive X‐ray spectrometer analysis, and the measured lattice parameters. Addition of SrTiO 3 , having a much smaller grain size in comparison with that of Nd(Zn 1/2 Ti 1/2 )O 3 , could effectively hold back abnormal grain growth in the Nd(Zn 1/2 Ti 1/2 )O 3 matrix. Evaporation of Zn at high temperatures caused an increase in the dielectric loss of the system. The temperature coefficient of resonant frequency increases with increasing SrTiO 3 content and tunes through zero at x =0.52. Specimens with x =0.52 possessed an excellent combination of microwave dielectric properties: ɛ r ∼54.2, Q × f ∼84 000 GHz, and τ f ∼0 ppm/°C. It is proposed as a suitable candidate material for today's 3G passive components and small‐sized GPS patch antennas.