Phase-shift correction in three-dimensional imaging using foward-scattering photoemission and Auger spectoscopies

We invert high-energy (E{≥}400 eV) photoelectron and Auger-electron interference patterns to construct 3D images of surface and interface atoms. A new scheme is introduced to correct the phase shift of the image. Image reconstruction is demonstrated for Si(111) {}3 ×{} {}3 -B, a system in which multiple-scattering effects are small and all source waves are equivalent. Using diffraction results from multiple-scattering slab calculations, we achieve a spatial resolution of 1.0--1.3 {}, thus qualifying the technique as a direct structural tool.