Sputtered thin films with compositions consisting of Co/sub 75/NI/sub 25/, (Co/sub 75/Ni/sub 25/)/sub 90/Mo/sub 10/, and (Co/sub 75/Ni/sub 25/)/sub 90/Ta/sub 10/ atomic percent were evaluated relative to their magnetic properties as a function of thickness. The maximum coercive force at the optimum thickness (300-AA) films. Magnetization reversal of thick films (1000 AA) was primarily determined by domain wall displacement, which may be followed by coherent rotation. The magnetization reversal in thin films, i.e. at the optimum thickness for maximum coercive force, primarily agrees with a chain-of-spheres model or a fanning mechanism.>
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Fisher et al. (1990) studied this question.
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