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We recently demonstrated that insulating surface impurity phases in high-temperature superconductors can be detected by thermally stimulated luminescence. Moreover, we suggested that the intensity of luminescence is related to the magnitude of the rf surface resistance. In this work we show that a quantitative correlation exists between these two quantities, and that luminescence can be a very useful technique for estimating rf surface resistance.
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Cooke et al. (1989) studied this question.
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