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January 1, 2001Journal of Electronic Imaging

Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors

Gu ̈nther Wernicke

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Abstract

The Journal of Electronic Imaging (JEI), copublished bimonthly with the Society for Imaging Science and Technology, publishes peer-reviewed papers that cover research and applications in all areas of electronic imaging science and technology.

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Cite This Study

Gu ̈nther Wernicke (2001) studied this question.

synapsesocial.com/papers/6a9eba3320336e6580f0c9d3 https://doi.org/10.1117/1.1318908

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