An evaluation of the relationship between signal‐to‐noise ratio (S/N) and integral accuracy, as a function of tip angle and relaxation delay, shows that the SIN decreases with increasing integral accuracy. At the expense of a slight decrease in integral accuracy, a substantial increase in SIN can be realized, and a procedure is presented for selecting the appropriate tip angle and relaxation delay.
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Traficante et al. (1994) studied this question.
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