Different transmission electron microscopy techniques have been compared for the detection and size measurements of ordered regions on a nanometer scale in a disordered matrix phase. As a model system, the perovskite lead magnesium niobate doped with varying amounts of La has been chosen for the present study. While selected area electron diffraction can reveal the existence of ordered structures, dark‐field contrast micrographs are usually used to reveal the spatial distribution and the size of ordered regions. However, for small ordered regions, a few nanometers in diameter, the measurements are no longer accurate because of superposition in projection. High‐resolution transmission electron microscopy (HRTEM) combined with image processing is shown to be a suitable technique to provide a quantitative measurement of such localized ordering. The detection limit of this method is discussed in detail, using the experimental results and HRTEM image simulations.
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Pan et al. (1998) studied this question.
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