We present a comparative study of the nucleation and growth of pentacene monolayer islands in the submonolayer regime onto inorganic substrates of SiO₂ and sapphire (Al₂O₃) and organic substrates of poly(methyl-metacrylate) (PMMA). We have determined the scaling laws that govern the saturated nucleation density per unit area N as a function of two essential deposition parameters: the deposition rate κ and the substrate temperature Tₛ. For all substrates, we found N∝κ^δ, with 0.8δ1.2, and the Tₛ dependence of the nucleation density follows a typical activated Arrhenius law. Whereas a critical nucleus size of $i=2$ is obtained for all investigated substrates, the activation energy for nucleation depends significantly on the dielectric. The difference in activation energy of nucleation on PMMA and SiO₂ is due to different molecule-substrate interactions.
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Pratontep et al. (2005) studied this question.
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