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Arsenic antisites in GaAs layers grown by molecular-beam epitaxy at low substrate temperatures (∼200 °C) were observed using electron paramagnetic resonance (EPR), magnetic circular dichroism in absorption (MCDA), and MCDA-detected EPR. This observation confirms that there is a MCDA band directly associated with arsenic antisites in the GaAs layers.
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Sun et al. (1992) studied this question.
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