F1 progeny from diallel crosses (reciprocals included) among five wheat (Triticum aestivum L.) cultivars were tested in the greenhouse for reaction to infection by Leptosphaeria nodorum Muller [imperfect stage = Septoria nodorum (Berk.) Berk.], the cause of glume blotch. In a separate experiment, four wheat parents and all F1, F2, and backcrosses were likewise tested for reaction to the pathogen. Significant effects were found for additive, dominance, and additive ✕ additive genetic effects as well as heterosis. Cultivars with the additive type resistance were ‘Oasis’ and ‘Blueboy II’ in Exp. I and Oasis in Exp. II. Crosses involving ‘McNair 1813’, a susceptible parent, demonstrated heterosis for a more resistant reaction. These results indicate that resistance to S. nodorum is inherited in a very complex manner and that several genes may be involved.
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Nelson et al. (1982) studied this question.
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