A four-circle diffractometer mounted on an alignment carriage has been installed at the branch beamline BL-10A for use with the synchrotron x rays at the Photon Factory. The optical design and diffractometry are described. This system was used for x-ray anomalous scattering studies on the ordering effect in a ternary system and the atomic distribution in superlattice films. A technique developed that can extract the x-ray intensity by anomalous scattering from total intensity was applied to studies on K-shell electrons in (Co, Ni, Zn)SiO3 and SrTiO3.
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Satoshi Sasaki (1989) studied this question.
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