Development of Ft-Ir Attenuated Total Internal Reflection Dichroism Techniques for Structural Characterization of Polymer Surfaces

We describe our continuing effort to develop FT-IR attenuated total reflection (ATR) dichroism techniques for the characterization of polymer surface structure and molecular orientation. Following theoretical background, we review the two-dimensional and three-dimensional analyses work based on a specially designed internal reflection crystal and a specially built ATR-sample attachment. In the current development section, we describe briefly the intensity correction procedures used in variable angle studies and an attempt to design a hemispheric crystal attachment to eliminate problems encountered with face-cut reflection crystals.