Matrix correction in x‐ray fluorescence analysis by the effective coefficient method

Up till now, the well known effective coefficient method was used by referring to a single standard. The SFP (Siemens fundamental parameter) program additionally allows this method to be employed with several standards and to analyse samples containing an element that is not analysed. A modified algorithm, called the trace model, yields an improvement in the precision of the trace element analysis. The different variants are illustrated by practical applications.