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Scanning thermal microscopy (SThM) has been used to study Joule heating in conjugated polymer light‐emitting diodes (LEDs; see Figure). The operational temperature of the LED is found to be a strong function of device area: smaller LEDs exchange heat more efficiently with their surrounding environment. The results suggest that at high current density, Joule heating may be linked to device failure.
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Boroumand et al. (2004) studied this question.
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