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An x-ray study of deformed Ti, Zr and Hf was performed. A Fourier analysis of line profiles revealed an absence of faulting in Zr and Hf while a small deformation fault probability (0·008) was found for deformed Ti. The results are discussed in the light of earlier results and present theories on deformation faulting.
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Lele et al. (1967) studied this question.
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