As a factor important to fabric quality, reed marks are studied by theoretical and experimental methods. In order to analyze their appearance, the power spectrum of a fabric's image is simulated in terms of that fabric's geometry. These power spectra offer peaks of wavelength coincident with the reed spacing. Further, they are used as an indicator to explain reed marks in terms of packed warps. At this same wavelength in experimental power spectra, there is also a peak that exhibits dependence on fabric quality. This peak adequately describes the appearance of the reed marks and thus can be used as a quality indicator for a woven fabric.
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Sakaguchi et al. (2000) studied this question.
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