An optical ray trace luster prediction computer model is used to explain the reduced dye yield of microdenier yarns. Results from the model demonstrate that the reduced dye yield is a necessary consequence of the reduced path length of light inside the filaments. Data are shown for the predicted brightness of a set of standard denier per filament and microdenier PET ( Micromattique ) yarns.
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Kobsa et al. (1993) studied this question.
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